I n’a fɔ sɛgɛsɛgɛlikɛminɛn min nafa ka bon fanga sɔrɔcogo la, tension sɛgɛsɛgɛlikɛlaw ka sumanikɛcogo ɲuman n’u ka dannaya bɛ nɔ bila tigitigi kuran minɛnw baaracogo ɲuman n’u ladonni na. O la, jogoɲini fɛɛrɛ gɛlɛn dɔ nafa ka bon kosɛbɛ walasa ka tension sɛgɛsɛgɛlikɛla sabatilen ka baarakɛcogo sabati. Nin barokun bɛna sɛgɛsɛgɛli kɛ jogoɲini yɔrɔ jɔnjɔnw kan, minnu bɛ kɛ ka tension sɛgɛsɛgɛlikɛlaw ye ka bɔ hakilina naani na: dilancogo sɛgɛsɛgɛli, baarakɛcogo kɔlɔsili, jateminɛ kɛcogo ɲɛfɔlenw, ani sigida ladamuni sɛgɛsɛgɛli.
dannaya sɛgɛsɛgɛli min bɛ kɛ dilancogo dakun na .
Voltage tester quality jusigilan bɛ a daminɛ na. Enzeniyɛriw ka kan ka EMC (Electromagnetic Compatibility) simulation ani circuit stabilité analysis kɛ walasa ka a jira ko minɛn bɛ se ka kunnafoni tigitigiw bɔ hali kuran-magnetiki sigida gɛlɛnw na. Misali la, high-voltage isolation circuits ka kan ka IEC 61010 sariyaw labato walasa ka sumani filiw bali walima hali minɛnw tiɲɛni min bɛ sɔrɔ bɔgɔbɔli walima tiɲɛni fɛ. O tɛmɛnen kɔ, algorisimu ka baarakɛcogo ɲɛnabɔli ni numérique signal processing modules ye (i n’a fɔ ka baara kɛ ni filɛri cɛmancɛ ye walasa ka fanga frequency interférence bali) o fana ye fɛnba ye walasa ka tiɲɛniw ɲɛ ka taa a fɛ.
Taabolow kɔlɔsili sɛnɛ waati la .
A dilanni taabolo la, yɔrɔw sɛgɛsɛgɛli ye lafasali sira fɔlɔ ye. Misali la, ADC (ANALOG-To-Digital Converter) ka sinsinni ka kan ka kɔlɔsi ±0,01% kɔnɔ, wa sɛgɛsɛgɛli resistɛri ka funteni hakɛ ka kan ka dɔgɔya ka tɛmɛ 50ppm/℃kan. Otomatiki sɛgɛsɛgɛli (AOI) lajɛ waati la, o bɛ se ka solder defauts dɔn joona, ka sɔrɔ baarakɛcogo sɛgɛsɛgɛli sigilanw bɛ baarakɛcogo juguw ladege (i n’a fɔ donta voltage sudden 120% nafa hakɛ fɔlen) walasa ka lakana kafoba ka baarakɛcogo ɲuman sɛgɛsɛgɛ. Kɛrɛnkɛrɛnnenya la, kuran bɔli (ESD) lakanani fɛɛrɛw bɛ waleya taabolo bɛɛ kɔnɔ-Contact dischact immunity ka kan ka bɛn ±8kv ma.
Calibration system ani traceability ɲɛnabɔli .
Voltage tester kelen-kelen bɛɛ bɛ multi-stage calibration sɔrɔ ka sɔrɔ ka bɔ izini na: fɔlɔ, full{1}}scale point-By{. Calibration data ka kan ka bila LIMS (Laboratory Information Management System) kɔnɔ walasa ka tugu ɲɔgɔn kɔ ani ka re{7}}sɛgɛsɛgɛli kɛ kalo 12 o kalo 12. Minɛnw na minnu bɛ se ka ta, sɛgɛsɛgɛli wɛrɛw ka kan ka kɛ zeru-point drift la batiri kɔnɔ-cogo fanga la (a ka c’a la, a bɛ dɔgɔya walima ka bɛn 0,1%FS/san ma).
Lamini ladamuni sɛgɛsɛgɛli min bɛ bonya .
Walasa ka foro cogoya gɛlɛnw kunbɛn, fɛnw ka kan ka sɛgɛsɛgɛli saba kɛ minnu bɛ se ka kɛ:
•funteni ni nɛnɛ jiginni (-20 degɛrɛ la ka se degere 60 ma , 95% RH) walasa ka sigili sɛgɛsɛgɛ;
•Mekaniko yɛrɛyɛrɛ (5-2000Hz yɛrɛyɛrɛli) walasa ka sigicogo fanga jateminɛ ;
•Salt fiyɛli sɛgɛsɛgɛli (san 96 la degere 35 ) walasa ka sɔgɔli kɛcogo jateminɛ.
Baarakɛcogo kɛrɛnkɛrɛnnenw (i n’a fɔ nukiliya fanga) bɛ fiɲɛ tangacogo sɛgɛsɛgɛli wɛrɛw wajibiya.
Industriw ka taabolo ni gɛlɛyaw .
Jogoɲini bɛ ka taa ɲɛ sisan hakili la: masin kalanni{0}}Ladonni kofɔlenw basigilen bɛ se ka sensɛri kɔrɔya taabolo dɔn ni cɛsiri ye, k’a sɔrɔ blockchain fɛɛrɛ bɛ kɛ ka tamper-hakilila seerew ɲɛnabɔli sabati. Nka, bɛnbaliya min bɛ miniaturisation ni tiɲɛniba cɛ (i n’a fɔ funteni musaka gɛlɛya chip-Level Testers) bɛ to ka kɛ gɛlɛya jɔnjɔn ye izini na.
Kuma surun na, voltage sɛgɛsɛgɛlikɛlaw ka jogoɲini ye porozɛ ye min bɛ kɛ cogo labɛnnen na, min bɛ jɛkafɔ de wajibiya fɛnw dilancogo bɛɛ lajɛlen na, k’a ta R&D la ka se a kɔfɛ{0}}feere baara ma. Ni farikolo sɛgɛsɛgɛli gɛlɛnw ni ɲɛnabɔli nizɛri faralen ɲɔgɔn kan, o dɔrɔn de bɛ se ka kɛ tiɲɛ na sumanikɛcogo dafalen ye min bɛ se ka da a kan fanga lakanani kama.